3D inspection of unpopulated printed circuit boards
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates. Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates. Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.
Application challenge
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.
Measurement method and system
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.
The problem
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.
The method
Conventional inspection systems such as measuring microscopes are not suitable as an automated inline solution because the inspection process takes a long time and these microscopes are very expensive. Therefore, 3D sensors from Micro-Epsilon are used to enable fully automated inline inspection of the substrates.