Measurement of the diameter of profiles
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system. Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system. Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.
Application challenge
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.
Measurement method and system
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.
The problem
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.
The method
Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.