Wavefront metrology for machine vision applications
Wavefront measurement solutions for testing the imaging quality of imaging optics on axis and at field points.
Wavefront metrology for machine vision applications is an application documented by Optocraft. This page summarizes the engineering task and the system-selection considerations for an Elina implementation.
Application challenge
Wavefront measurement solutions for testing the imaging quality of imaging optics on axis and at field points.
Measurement or test approach
The optical system uses wavefront sensing and application-specific optics or illumination to quantify optical quality, alignment or laser-beam characteristics.
Topics covered by the manufacturer
- Our solution for machine vision applications
Information required for system selection
Define aperture, wavelength, wavefront range, spatial resolution, required accuracy, test geometry and software interface.
The problem
Wavefront measurement solutions for testing the imaging quality of imaging optics on axis and at field points.
The method
The optical system uses wavefront sensing and application-specific optics or illumination to quantify optical quality, alignment or laser-beam characteristics.
The result
The delivered configuration must be verified against the operating envelope and performance required by the application.