reflectCONTROL Measurement & 3D systems
reflectCONTROL: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
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Models in the series
One column per model: what differs between the models of the series.
| Parameter | RCS 110-245 2D eli-m-1900e2c680d4529ec7923a45 | RCS130-160 3D HLP eli-m-cfa9659908ad6fdbbb76b066 |
|---|---|---|
| interface_specification | Unknown | Digital I/O |
| quantity_specification | Not specified | RCS130-160 3D HLP measuring field is about 170 x 160 mm |
| Interfaces | Not specified | ethernet |
| אורך שטח המדידה הפעיל | Not specified | 170 mm |
| רוחב שטח המדידה הפעיל | Not specified | 160 mm |
| Status | Active | Active |
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Frequently asked questions
Answers to the most common questions about our products and services
It uses phase-measuring deflectometry. A striped pattern is reflected by the target into the cameras, and pattern distortions are evaluated for surface inspection.
No. RCS130-160 3D HLP outputs a 3D point cloud. RCS110-245 2D outputs base-intensity, amplitude and curvature images. Select according to the required result.
The manufacturer identifies shape inspection of reflective surfaces, including flatness, deflection and curvature. Match the target, measurement field and result analysis to the inspection task.
No. Resolution and detection of a small deviation do not define absolute height error. Use the selected model’s performance definition and measurement conditions.
The source describes GigE Vision with GenICam data, 3DInspect software and an SDK with C++ examples. Select evaluation software and processing components for the sensor model and application.
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