thicknessGAUGE O.IMS Interferometers
thicknessGAUGE O.IMS: sensors and measurement devices by Micro-Epsilon for interferometers.
This series on the Micro-Epsilon site (opens in a new tab)
Models in the series
One column per model: what differs between the models of the series.
| Parameter | thicknessGAUGE O.IMS eli-m-9ea40975fd562b30f0efca48 |
|---|---|
| quantity_specification | 0.01 mm thickness measuring range; 1250 mm named measuring width. |
| interface_specification | Analog 0-10V |
| source_repeatability_basis | Repeatability not stated in the reviewed official source. |
| Interfaces | ethercat |
| System accuracy | 0.2 µm |
| Maximum material width | 1250 mm |
| Status | Active |
The industries we serve
Frequently asked questions
Answers to the most common questions about our products and services
White-light interferometry for one-sided thickness/coating measurement.
For stable traversal over the film, with rollers stabilizing the material.
No. Fixed-track measurement is also available for the task.
No. Select width, thickness span and suitable material separately.
No. Motion, automatic calibration, PC and software form part of the solution.
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