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thicknessGAUGE O.IMS Interferometers

thicknessGAUGE O.IMS: sensors and measurement devices by Micro-Epsilon for interferometers.

This series on the Micro-Epsilon site (opens in a new tab)

Models in the series

One column per model: what differs between the models of the series.

Models of thicknessGAUGE O.IMS compared by parameter
Parameter thicknessGAUGE O.IMS eli-m-9ea40975fd562b30f0efca48
quantity_specification 0.01 mm thickness measuring range; 1250 mm named measuring width.
interface_specification Analog 0-10V
source_repeatability_basis Repeatability not stated in the reviewed official source.
Interfaces ethercat
System accuracy 0.2 µm
Maximum material width 1250 mm
Status Active

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Frequently asked questions

Answers to the most common questions about our products and services

White-light interferometry for one-sided thickness/coating measurement.

For stable traversal over the film, with rollers stabilizing the material.

No. Fixed-track measurement is also available for the task.

No. Select width, thickness span and suitable material separately.

No. Motion, automatic calibration, PC and software form part of the solution.

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