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interferoMETER 5420-TH Interferometers

interferoMETER 5420-TH: sensors and measurement devices by Micro-Epsilon for interferometers.

Download the datasheet (opens in a new tab) This series on the Micro-Epsilon site (opens in a new tab)

Models in the series

One column per model: what differs between the models of the series.

Models of interferoMETER 5420-TH compared by parameter
Parameter IMS5420-TH eli-m-1717be0736a20120070ab740 IMS5420IP67-TH eli-m-266e4234f52df4e5190eed74 IMS5420IP67MP-TH eli-m-da53372092fd6995a4f93516 IMS5420MP-TH eli-m-69fb714700dcddabcbee9b3b
Thickness measuring range 50–1050 µm 50–1050 µm 50–1050 µm 50–1050 µm
Working distance 21–22 mm 21–22 mm 21–22 mm 21–22 mm
interface_specification RS422 / RS485 Analog 0-10V Digital I/O RS422 / RS485
Protection class (DIN EN 60529) ip40 ip40 ip40 ip40
source_sampling_rate_basis IMS5420-TH controller IMS5420IP67-TH controller IMS5420IP67MP-TH controller IMS5420MP-TH controller
Interfaces rs422 rs422 ethercat profinet
rate_interval 100–6000 Hz Not specified Not specified Not specified
Resolution 0.001 µm Not specified Not specified Not specified
Measuring rate 6000 Hz Not specified Not specified Not specified
quantity_specification 50-1050 µm documented material-thickness interval 50-1050 µm documented material-thickness interval 50-1050 µm documented material-thickness interval 50-1050 µm documented material-thickness interval
Linearity 0.1 µm 0.1 µm Not specified Not specified
Contact Non-contact Non-contact Non-contact Non-contact
Accuracy 0.1 µm 0.1 µm 0.1 µm 0.1 µm
ADC sampling rate 6000 samples/s 6000 samples/s 6000 samples/s 6000 samples/s
Status Active Active Active Active
Datasheet PDF — IMS5420-TH (opens in a new tab) PDF — IMS5420IP67-TH (opens in a new tab) PDF — IMS5420IP67MP-TH (opens in a new tab) PDF — IMS5420MP-TH (opens in a new tab)

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Frequently asked questions

Answers to the most common questions about our products and services

It measures silicon-wafer thickness and suitable materials transparent around 1100 nm, including semiconductor applications. Material suitability depends on the configuration.

It is the documented range at refractive index 3.82, but the footnote states measurable thickness depends on doping. Check the wafer and conditions.

No. Housing, fiber/electrical connections and interfaces differ. The IP67 table does not include the standard version’s analog output or synchronization inputs.

No. Standard versions need a module for PROFINET and EtherNet/IP; IP67 versions also list EtherCAT as optional through a module.

IMP TH24 has a 24±3 mm working distance; silicon thickness range is 0.05–1.05 mm under specified conditions. They are separate selection dimensions.

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