thicknessCONTROL STG 8102.K
thicknessCONTROL STG 8102.K: sensors and measurement devices by Micro-Epsilon for distance & displacement sensors.
Download the datasheet (opens in a new tab) This series on the Micro-Epsilon site (opens in a new tab)
Shared technical specifications for the series
Properties every model in the series has. What differs is in the models table below.
Range across models
The span covered by the models of the series together — not the range of each model.
| System accuracy | 0.4–2.5 µm |
|---|---|
| Resolution | 0.07–0.36 µm |
| Repeatability | 0.3–2 µm |
Models in the series
One column per model: what differs between the models of the series.
| Parameter | thicknessCONTROL STG 8102.K-10/1000 eli-m-d311e1255c9d8ebb59b3d457 | thicknessCONTROL STG 8102.K-10/250 eli-m-6bc97f395f4f908d730e616e | thicknessCONTROL STG 8102.K-10/500 eli-m-e480146adc5ca458dae56517 | thicknessCONTROL STG 8102.K-3/250 eli-m-9ef896ea7e72a8c035c85aef | thicknessCONTROL STG 8102.K-3/500 eli-m-5a9dd4d487b01c11c18c3fdd | thicknessCONTROL STG 8102.K-30/1000 eli-m-fbdca51871bbbc9b4028499e | thicknessCONTROL STG 8102.K-30/250 eli-m-97068ddcbeb9cc5266b0f184 | thicknessCONTROL STG 8102.K-30/500 eli-m-cf9a5aec4916dbaa0a8e6285 |
|---|---|---|---|---|---|---|---|---|
| Interfaces | profinet | ethernet | ethernet | profinet | profinet | ethercat | ethercat | profinet |
| quantity_specification | 10 mm thickness measuring range; 1000 mm named measuring width; article 4350127.43. | 10 mm thickness measuring range; 250 mm named measuring width; article 4350127.41. | 10 mm thickness measuring range; 500 mm named measuring width; article 4350127.42. | 3 mm thickness measuring range; 250 mm named measuring width; article 4350127.410. | 3 mm thickness measuring range; 500 mm named measuring width; article 4350127.411. | 30 mm thickness measuring range; 1000 mm named measuring width; article 4350127.46. | 30 mm thickness measuring range; 250 mm named measuring width; article 4350127.44. | 30 mm thickness measuring range; 500 mm named measuring width; article 4350127.45. |
| source_sampling_rate_basis | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. | Official maximum measurement or output rate: 70,000 Hz. |
| interface_specification | Digital I/O | Analog 0-10V | Digital I/O | Digital I/O | Analog 0-10V | Digital I/O | Analog 0-10V | Digital I/O |
| Maximum material width | 1000 mm | 250 mm | 500 mm | 250 mm | 500 mm | 1000 mm | 250 mm | 500 mm |
| System accuracy | 0.7 µm | 0.7 µm | 0.7 µm | 0.4 µm | 0.4 µm | 2.5 µm | 2.5 µm | 2.5 µm |
| Operating temperature | 5–70 °C | 5–70 °C | 5–70 °C | 5–70 °C | 5–70 °C | 5–70 °C | 5–70 °C | 5–70 °C |
| source_repeatability_basis | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. | Official source value, normally stated at 2 sigma where identified in the family table. |
| Resolution | 0.12 µm | 0.12 µm | 0.12 µm | 0.07000000000000001 µm | 0.07000000000000001 µm | 0.36 µm | 0.36 µm | 0.36 µm |
| Repeatability | 0.5 µm | 0.5 µm | 0.5 µm | 0.3 µm | 0.3 µm | 2 µm | 2 µm | 2 µm |
| Contact | Non-contact | Non-contact | Non-contact | Non-contact | Non-contact | Non-contact | Non-contact | Non-contact |
| ADC sampling rate | 70000 samples/s | 70000 samples/s | 70000 samples/s | 70000 samples/s | 70000 samples/s | 70000 samples/s | 70000 samples/s | 70000 samples/s |
| Status | Active | Active | Active | Active | Active | Active | Active | Active |
| Datasheet | PDF — thicknessCONTROL STG 8102.K-10/1000 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-10/250 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-10/500 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-3/250 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-3/500 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-30/1000 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-30/250 (opens in a new tab) | PDF — thicknessCONTROL STG 8102.K-30/500 (opens in a new tab) |
The industries we serve
Frequently asked questions
Answers to the most common questions about our products and services
Confocal technology for thickness measurement. Select suitable head pair, range and system geometry.
The catalogue covers thin films, complex surfaces and transparent coatings. Exact suitability requires material, reflectance and configuration review.
No. System accuracy/repeatability vary by span. Preserve the 2-sigma basis and material/installation conditions.
No. It separates reflections/layers in suitable configurations, but material, surfaces and intended measurand must still be defined.
Compare the same thickness task, working range, material and system rate. Line point count is not confocal accuracy and calibration methods are not interchangeable.
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