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surfaceCONTROL 3D 3200 Measurement & 3D systems

surfaceCONTROL 3D 3200: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.

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Download the datasheet (opens in a new tab) This series on the Micro-Epsilon site (opens in a new tab)
Official manufacturer family photo — housings from both the 3200 and 3500 series are shown

Shared technical specifications for the series

Properties every model in the series has. What differs is in the models table below.

Range across models

The span covered by the models of the series together — not the range of each model.

Range across the models of surfaceCONTROL 3D 3200
Repeatability 0.4–1.8 µm
X measuring range 30–235 mm
Resolution 1–5 µm
Y measuring range 18.5–150 mm
Y resolution 12–90 µm
Working distance 120–500 mm
X resolution 12–90 µm
Z measuring range 6–120 mm
Operating temperature 0–45 °C
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Models in the series

One column per model: what differs between the models of the series.

Models of surfaceCONTROL 3D 3200 compared by parameter
Parameter SC3200-120 eli-m-5ca6ec21bba12f3f96e98c82 SC3200-240 eli-m-3bcc12a579f97722a6b64c5f SC3200-30 eli-m-d2502143b0d8e145a30de4ad SC3200-80 eli-m-c1e9a17348bd0b457f93a7c8 SC3210-120 eli-m-9cea947159733fdc60aefcda SC3210-240 eli-m-27fcedfbaef1c01a402fd499 SC3210-30 eli-m-2fb7c35042e1bc54149beb2c SC3210-80 eli-m-8e7b753714bae3d3591afcd7
Repeatability 1.2 µm 1.8 µm 0.4 µm 0.6 µm 1.2 µm 1.8 µm 0.4 µm 0.6 µm
X measuring range 115 mm 235 mm 30 mm 75 mm 115 mm 235 mm 30 mm 75 mm
Resolution 3.4 µm 5 µm 1 µm 1.5 µm 3.4 µm 5 µm 1 µm 1.5 µm
source_sampling_rate_basis Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot. Official acquisition time 0.3-0.7 s per snapshot.
Y measuring range 75 mm 150 mm 18.5 mm 50 mm 75 mm 150 mm 18.5 mm 50 mm
Protection class (DIN EN 60529) ip67 ip67 ip67 ip67 ip67 ip67 ip67 ip67
Interfaces profinet profinet ethercat profinet ethercat profinet ethercat profinet
interface_specification Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O
Y resolution 45 µm 90 µm 12 µm 30 µm 45 µm 90 µm 12 µm 30 µm
source_repeatability_basis Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range.
quantity_specification Start 100 x 70 mm at 191 mm; center 115 x 75 mm at 206 mm; end 115 x 79 mm at 221 mm. Start 180 x 130 mm at 380 mm; center 235 x 150 mm at 440 mm; end 235 x 170 mm at 500 mm. Start 29.5 x 18 mm at 127 mm; center 30 x 18.5 mm at 130 mm; end 30.5 x 19 mm at 133 mm. Start 65 x 47 mm at 120 mm; center 75 x 50 mm at 130 mm; end 74 x 53 mm at 140 mm. Start 100 x 70 mm at 191 mm; center 115 x 75 mm at 206 mm; end 115 x 79 mm at 221 mm. Start 180 x 130 mm at 380 mm; center 235 x 150 mm at 440 mm; end 235 x 170 mm at 500 mm. Start 29.5 x 18 mm at 127 mm; center 30 x 18.5 mm at 130 mm; end 30.5 x 19 mm at 133 mm. Start 65 x 47 mm at 120 mm; center 75 x 50 mm at 130 mm; end 74 x 53 mm at 140 mm.
ADC sampling rate 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s 3.333333333333333 samples/s
Working distance 191–221 mm 380–500 mm 127–133 mm 120–140 mm 191–221 mm 380–500 mm 127–133 mm 120–140 mm
X resolution 45 µm 90 µm 12 µm 30 µm 45 µm 90 µm 12 µm 30 µm
Z measuring range 30 mm 120 mm 6 mm 20 mm 30 mm 120 mm 6 mm 20 mm
source_three_d_scanner_type Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot
Operating temperature 0–45 °C 0–40 °C 0–45 °C 0–45 °C 0–45 °C 0–40 °C 0–45 °C 0–45 °C
Status Active Active Active Active Active Active Active Active
Datasheet PDF — SC3200-120 (opens in a new tab) PDF — SC3200-240 (opens in a new tab) PDF — SC3200-30 (opens in a new tab) PDF — SC3200-80 (opens in a new tab) PDF — SC3210-120 (opens in a new tab) PDF — SC3210-240 (opens in a new tab) PDF — SC3210-30 (opens in a new tab) PDF — SC3210-80 (opens in a new tab)

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Frequently asked questions

Answers to the most common questions about our products and services

It projects a pattern sequence and records it with two cameras to calculate an area’s 3D point cloud, rather than one point.

No. SC3210 includes the 3DInspect Automation extension; SC3200 does not. Match licensing and evaluation path.

No. The best tabulated value applies to the small field; values vary by model. EnhancedSNR, a 3×3 mean filter and specified test conditions also apply.

No. Specified acquisition time excludes processing and evaluation. Plan cycle time for the settings, computer and interface in use.

The table footnote requires a 2D/3D Gateway. Evaluation may use 3DInspect or customer software according to configuration; not every listed interface is onboard.

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