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surfaceCONTROL 3D 3500 Measurement & 3D systems

surfaceCONTROL 3D 3500: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.

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Download the datasheet (opens in a new tab) This series on the Micro-Epsilon site (opens in a new tab)
Manufacturer visual; model-specific labels and scope are defined in gallery bindings

Shared technical specifications for the series

Properties every model in the series has. What differs is in the models table below.

Range across models

The span covered by the models of the series together — not the range of each model.

Range across the models of surfaceCONTROL 3D 3500
Y resolution 8–60 µm
X resolution 8–60 µm
Resolution 0.7–4 µm
Repeatability 0.25–1.4 µm
Z measuring range 6–120 mm
X measuring range 30–240 mm
Working distance 120–500 mm
Y measuring range 18.5–150 mm
Operating temperature 0–45 °C
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Models in the series

One column per model: what differs between the models of the series.

Models of surfaceCONTROL 3D 3500 compared by parameter
Parameter SC3500-120 eli-m-af94c279242645d8c78782e2 SC3500-240 eli-m-b09a63274fd48481b808fb31 SC3500-30 eli-m-5a4709d8109aae1e097127d8 SC3500-80 eli-m-397b8f9eb1f1802c75f71626 SC3510-120 eli-m-d60ce1bdde2af13ea78b2eec SC3510-240 eli-m-fa37a6dad3d39194b9c98d02 SC3510-30 eli-m-997b18c2f3071418dafbddb5 SC3510-80 eli-m-1219e0b53e8b8cae9201bebc
Y resolution 30 µm 60 µm 8 µm 20 µm 30 µm 60 µm 8 µm 20 µm
X resolution 30 µm 60 µm 8 µm 20 µm 30 µm 60 µm 8 µm 20 µm
Interfaces ethercat ethercat ethercat ethernet ethercat ethernet profinet ethercat
Resolution 2 µm 4 µm 0.7 µm 1 µm 2 µm 4 µm 0.7 µm 1 µm
source_repeatability_basis Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range. Official Z repeatability measured on a ground metal plate at the center of the measuring range.
quantity_specification Start 107.5 x 70 mm at 191 mm; center 120 x 75 mm at 206 mm; end 123.5 x 80 mm at 221 mm. Start 190 x 130 mm at 380 mm; center 240 x 150 mm at 440 mm; end 245 x 170 mm at 500 mm. Start 29.5 x 18 mm at 127 mm; center 30 x 18.5 mm at 130 mm; end 30.5 x 19 mm at 133 mm. Start 67.5 x 46 mm at 120 mm; center 80 x 50 mm at 130 mm; end 77.5 x 52 mm at 140 mm. Start 107.5 x 70 mm at 191 mm; center 120 x 75 mm at 206 mm; end 123.5 x 80 mm at 221 mm. Start 190 x 130 mm at 380 mm; center 240 x 150 mm at 440 mm; end 245 x 170 mm at 500 mm. Start 29.5 x 18 mm at 127 mm; center 30 x 18.5 mm at 130 mm; end 30.5 x 19 mm at 133 mm. Start 67.5 x 46 mm at 120 mm; center 80 x 50 mm at 130 mm; end 77.5 x 52 mm at 140 mm.
Repeatability 0.7 µm 1.4 µm 0.25 µm 0.4 µm 0.7 µm 1.4 µm 0.25 µm 0.4 µm
Z measuring range 30 mm 120 mm 6 mm 20 mm 30 mm 120 mm 6 mm 20 mm
ADC sampling rate 5 samples/s 5 samples/s 5 samples/s 5 samples/s 5 samples/s 5 samples/s 5 samples/s 5 samples/s
X measuring range 120 mm 240 mm 30 mm 80 mm 120 mm 240 mm 30 mm 80 mm
Protection class (DIN EN 60529) ip67 ip67 ip67 ip67 ip67 ip67 ip67 ip67
interface_specification Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O Digital I/O
Working distance 191–221 mm 380–500 mm 127–133 mm 120–140 mm 191–221 mm 380–500 mm 127–133 mm 120–140 mm
source_three_d_scanner_type Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot Snapshot
source_sampling_rate_basis Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot. Official acquisition time 0.2-0.4 s per snapshot.
Y measuring range 75 mm 150 mm 18.5 mm 50 mm 75 mm 150 mm 18.5 mm 50 mm
Operating temperature 0–45 °C 0–40 °C 0–45 °C 0–45 °C 0–45 °C 0–40 °C 0–45 °C 0–45 °C
Status Active Active Active Active Active Active Active Active
Datasheet PDF — SC3500-120 (opens in a new tab) PDF — SC3500-240 (opens in a new tab) PDF — SC3500-30 (opens in a new tab) PDF — SC3500-80 (opens in a new tab) PDF — SC3510-120 (opens in a new tab) PDF — SC3510-240 (opens in a new tab) PDF — SC3510-30 (opens in a new tab) PDF — SC3510-80 (opens in a new tab)

The industries we serve

Frequently asked questions

Answers to the most common questions about our products and services

Precise 3D geometry and surface measurement on diffusely reflecting surfaces. Match measuring field and surface properties to the application.

No. It uses LED pattern projection and two cameras. An area is acquired through a pattern sequence rather than sweeping a laser line.

It applies to the small-field model with EnhancedSNR, 3×3 averaging, central field position, a cooperative surface and stable temperature, not every model.

No. Values vary with field size. XY resolution, z resolution and z repeatability are three separate specifications.

GigE Vision transfers point clouds for evaluation. Automated results require the appropriate 3DInspect license and communication path such as a gateway or processing unit.

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