combiSENSOR KSB6430
combiSENSOR KSB6430: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
Product categories
Laser triangulation
Capacitive
Inductive (eddy current)
Laser time-of-flight (TOF)
Draw-wire sensors
LVDT
Magnetic
Confocal chromatic
Interferometers
Colour & gloss measurement
Temperature sensors
Force
Weight
Torque
Noise & sound
Pressure sensors
Strain
Angle
Light intensity & surface quality
3D sensors
Confocal line scanners
Thickness measurement
Optical micrometers
Rotational speed
Laser scanners (2D/3D profile sensors)
Length measurement
Vibration and acceleration sensors
Shakers (vibration exciters)
Vibration controllers
Vibration calibrators
Software
Data acquisition
Accessories
Micro-Epsilon
Sensors and measuring systems from Germany
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Qlar (formerly Schenck Process) – weighing, feeding and flow measurement for bulk materials
Optocraft
Measuring systems for optics and lasers
Brüel & Kjær Vibro
Vibration monitoring for rotating equipment
Elovis
Non-contact systems for length and speed measurement
HBK
Load cells, strain gauges and data acquisition
HORIBA
Analytical instruments, emissions and flow control
Solutions
Products and components for measurement & 3d systems.
57 products
combiSENSOR KSB6430: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
combiSENSOR KSS64x0: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
confocalDT two-sided thickness setup: sensors and measurement devices by Micro-Epsilon for distance & displacement sensors.
confocalLINE CLI8500: sensors and measurement devices by Micro-Epsilon for distance & displacement sensors.
FTS 8101: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
optoCONTROL: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
optoCONTROL 1200: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
optoCONTROL 1201: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
optoCONTROL 2520: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
optoCONTROL 2700: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
profileGAUGE X.LP-3D: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
reflectCONTROL: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
reflectCONTROL Automation: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL + 3D Profile Unit: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2500: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2510: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 25x0: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2900: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2910: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2950: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 2960: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 29x0: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 3000: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 3002: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 3010: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 3012: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 30xx: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 8200: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 8500: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
scanCONTROL 8x00: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
surfaceCONTROL 3D 2500: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
surfaceCONTROL 3D 2600: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
surfaceCONTROL 3D 3200: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
surfaceCONTROL 3D 3500: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
surfaceCONTROL 3D 3560: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL MTS 8201.LLT: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL MTS 8202.LLT: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL MTS 9201.LLT: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL MTS 9202.LLT: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL MWS 8201.LLT: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL STG 8101: system by Micro-Epsilon.
thicknessCONTROL STG 8101.EO: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessCONTROL STG 8102: system by Micro-Epsilon.
thicknessGAUGE 3D: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
thicknessGAUGE C.C: sensors and measurement devices by Micro-Epsilon for distance & displacement sensors.
Inline thickness measurement system with two laser triangulation sensors, automatic calibration and a traversing unit. System performance is specified per model.
thicknessGAUGE C.LP: sensors and measurement devices by Micro-Epsilon for measurement & 3d systems.
Certified quality management, calibration certificates and calibration services at manufacturers’ facilities.
Answers to the most common questions about our products and services
surfaceCONTROL is presented as a 3D snapshot geometry sensor; reflectCONTROL uses deflectometry for reflective surfaces. Select for surface and inspection task.
No. A snapshot captures an area; a line scanner produces profiles that can be combined with motion for 3D data. Select for geometry and part movement.
Define field of view, height variation, performance requirement, material and reflectance. Point count alone does not establish geometry accuracy.
The manufacturer presents 3DInspect for configuration/evaluation alongside software integration options. Match support to model and required data type.
No. Diffuse versus reflective surfaces are central to selecting principle and family. Also check geometry, angles and optical access.
In a supported system, 3DProfileUnit combines data from several scanCONTROL 30xx scanners in a common coordinate system and can use encoder position. Scanner positions and part motion must be configured; connecting several scanners to a network does not perform this alignment by itself.
Tell us what you need to measure and an engineer will get back to you.